[IEEE 2005 66th ARFTG Conference Measurement Conference Digital Communication System Metrics (ARFTG) - Washington, DC, USA (2005.12.1-2005.12.2)] 2005 66th ARFTG Microwave Measurement Conference (ARFTG) - Interlaboratory comparison of noise-parameter measurements on CMOS devices with 0.12 μm gate length

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