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[IEEE 2018 IEEE 8th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER) - Tianjin, China (2018.7.19-2018.7.23)] 2018 IEEE 8th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER) - Detection Research on Tiny Remainders Inside Sealed Electronic Components
Shicheng, Wang, Yongxin, Liu, Cuie, Li, Hong, Liang, Hongxi, XueYear:
2018
Language:
english
DOI:
10.1109/cyber.2018.8688119
File:
PDF, 101 KB
english, 2018