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[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Tuning Windowed Chi-Squared Detectors for Sensor Attacks
R, Tunga, Murguia, Carlos, Ruths, JustinYear:
2018
Language:
english
DOI:
10.23919/ACC.2018.8431073
File:
PDF, 587 KB
english, 2018