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[IEEE 2019 Silicon Nanoelectronics Workshop (SNW) - Kyoto, Japan (2019.6.9-2019.6.10)] 2019 Silicon Nanoelectronics Workshop (SNW) - ON Current Enhancement by Gate Controlled Strain in The InAs n-Type Piezoelectric Tunnel FETs
Long, Yuxiong, Huang, Jun Z, Wei, Zhongming, Luo, Jun-Wei, Jiang, XiangweiYear:
2019
Language:
english
DOI:
10.23919/SNW.2019.8782933
File:
PDF, 245 KB
english, 2019