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[IEEE 2019 Symposium on VLSI Technology - Kyoto, Japan (2019.6.9-2019.6.14)] 2019 Symposium on VLSI Technology - Comprehensive Scaling Study on 3D Cross-Point PCM toward 1Znm Node for SCM Applications
Chien, W.C., Ho, H.Y., Yeh, C.W., Yang, C.H., Cheng, H.Y., Kim, W., Kuo, I.T., Gignac, L.M., Lai, E.K., Gong, N., Chou, Y.C., Cheng, C.W., Lin, Y.F., Papalia, J.M., Carta, F., Rav, A., Bruce, R.L., BrYear:
2019
Language:
english
DOI:
10.23919/VLSIT.2019.8776516
File:
PDF, 3.10 MB
english, 2019