![](/img/cover-not-exists.png)
Examination of the Shape and Structure of (111)-oriented GaAs Tensile-Strained Quantum Dots using Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, and Atom Probe Tomography
Grossklaus, Kevin A., Schuck, Christopher F., Simmonds, Paul J., Vandervelde, Thomas E.Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619011772
Date:
August, 2019
File:
PDF, 226 KB
english, 2019