Resolution enhancement in scanning electron microscopy...

Scientific Reports 2019 / 12 Vol. 9; Iss. 1

Resolution enhancement in scanning electron microscopy using deep learning

de Haan, Kevin, Ballard, Zachary S., Rivenson, Yair, Wu, Yichen, Ozcan, Aydogan
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Volume:
9
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/s41598-019-48444-2
Date:
December, 2019
File:
PDF, 2.07 MB
english, 2019
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