Increasing throughput in X-ray computed tomography...

Measurement Science and Technology 2019 / 08

Increasing throughput in X-ray computed tomography measurement of surface topography using sinogram interpolation

Körner, Lars, Lawes, Simon, Bate, David, Newton, Lewis, Senin, Nicola, Leach, Richard K
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Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/1361-6501/ab37e5
Date:
August, 2019
File:
PDF, 1.06 MB
english, 2019
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