[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - DeepPath: Path-Driven Testing Criteria for Deep Neural Networks
Wang, Dong, Wang, Ziyuan, Fang, Chunrong, Chen, Yanshan, Chen, ZhenyuYear:
2019
Language:
english
DOI:
10.1109/AITest.2019.00013
File:
PDF, 287 KB
english, 2019