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[IEEE 2018 IEEE Applied Signal Processing Conference (ASPCON) - Kolkata, India (2018.12.7-2018.12.9)] 2018 IEEE Applied Signal Processing Conference (ASPCON) - Snickometer Edge Detection by Feature Extraction in TF Plane and Wavelet Domain

Ghosh, Avrajit, Chatterjee, Ayan, Roy, Arani, Mukherjee, Amitava, Naskar, Mrinal Kanti
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Year:
2018
Language:
english
DOI:
10.1109/ASPCON.2018.8748535
File:
PDF, 532 KB
english, 2018
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