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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Performance Analysis of Down Scaling Effect of Si based SRG Tunnel FET
Biswal, Sudhansu Mohan, Baral, Biswajit, Swain, Sanjit Kumar, Kumar Pati, SudhansuYear:
2018
Language:
english
DOI:
10.1109/EDKCON.2018.8770447
File:
PDF, 975 KB
english, 2018