[IEEE 2018 IEEE Electron Devices Kolkata Conference...

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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Stability Performance Comparison of a MTJ Memory Device Using Low-Dimensional HfO 2 , A1 2 O 3 , La 2 O 3 and h-BN as Composite Dielectric

Thapa, Abinash, Sarkar, Chandan Kumar, Sharma, Bikash
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Year:
2018
DOI:
10.1109/EDKCON.2018.8770505
File:
PDF, 842 KB
2018
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