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[IEEE 2018 IEEE Nanotechnology Symposium (ANTS) - Albany, NY, USA (2018.11.14-2018.11.15)] 2018 IEEE Nanotechnology Symposium (ANTS) - The Development of the Charge Transport Model To Predict Dielectric Failure
Xu, Yueming, Plawsky, Joel L., Lu, Toh-MingYear:
2018
DOI:
10.1109/NANOTECH.2018.8653558
File:
PDF, 842 KB
2018