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[IEEE 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2019.4.22-2019.4.25)] 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Silicon Process Impact on 5G NR mmWave Front End Design and Performance
Cheng, Chuan-Cheng, Dunworth, Jeremy, Kalpat, Sriram, Cheng, Haitao, Liu, Gang, Yang, Ming-Ta, Sy, Wing, Wang, Joseph, Sahota, Kamal, Chidambaram, PR. ChidiYear:
2019
DOI:
10.1109/VLSI-DAT.2019.8741576
File:
PDF, 587 KB
2019