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[IEEE 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Kita-Kyushu City, Fukuoka, Japan (2019.3.18-2019.3.21)] 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - A Study of Power Supply Stability in Ring Oscillator Structures
Smith, Brad, Hall, Donald, Verzi, Bill, Pechonis, DanYear:
2019
Language:
english
DOI:
10.1109/ICMTS.2019.8730980
File:
PDF, 321 KB
english, 2019