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[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Thin-Film FD-SOI BIMOS Topologies for ESD Protection
De Conti, Louise, Cristoloveanu, Sorin, Vinet, Maud, Galy, PhilippeYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720401
File:
PDF, 661 KB
english, 2019