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[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Soft Error Performance of High-Speed Pulsed-DICE-Latch Design in 16 nm and 7 nm FinFET Processes
Narasimham, B., Chandrasekharan, K., Wang, J. K., Bhuva, B. L.Year:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720408
File:
PDF, 422 KB
english, 2019