[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs
Mahmud, M. Iqbal, Gupta, A., Toledano-Luque, M., Mavilla, N., Johnson, J., Srinivasan, P., Zainuddin, A., Rao, S., Cimino, S., Min, B., Nigam, T.Year:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720535
File:
PDF, 1.33 MB
english, 2019