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[IEEE 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Shanghai, China (2019.5.19-2019.5.23)] 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Time-Resolved Short Circuit Failure Analysis of SiC MOSFETs
Ziemann, Thomas, Tsibizov, Alexander, Kakarla, Bhagyalakshmi, Bort, Lorenz, Grossner, UlrikeYear:
2019
Language:
english
DOI:
10.1109/ISPSD.2019.8757564
File:
PDF, 3.41 MB
english, 2019