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[IEEE 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) - JeJu, Korea (South) (2019.6.23-2019.6.26)] 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) - Feasibility of Machine Learning Algorithm for Test Partitioning
Wang, Senling, Al-Awadhi, Hanan T., Aohagi, Masatoshi, Higami, Yoshinobu, Takahashi, HiroshiYear:
2019
Language:
english
DOI:
10.1109/ITC-CSCC.2019.8793328
File:
PDF, 191 KB
english, 2019