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[IEEE 2019 IEEE Latin American Test Symposium (LATS) - Santiago, Chile (2019.3.11-2019.3.13)] 2019 IEEE Latin American Test Symposium (LATS) - A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells
Forero, Freddy, Galliere, Jean-Marc, Renovell, Michel, Champac, VictorYear:
2019
Language:
english
DOI:
10.1109/LATW.2019.8704612
File:
PDF, 826 KB
english, 2019