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[IEEE 2018 International Conference on System Modeling & Advancement in Research Trends (SMART) - Moradabad, India (2018.11.23-2018.11.24)] 2018 International Conference on System Modeling & Advancement in Research Trends (SMART) - Q-Analyze Tool to Detect Malicious and Black Hole Nodes in NS2 Simulation for AODV
Al-Shidi, Qasim, Alburaiki, Ahmed, Shaker, Hothefa, Kumar, BasantYear:
2018
Language:
english
DOI:
10.1109/SYSMART.2018.8746938
File:
PDF, 454 KB
english, 2018