Highly Reliable Memory Architecture Using Adaptive Combination of Proactive Aging-aware In-Field Self-Repair and ECC
Mayuga, Gian, Sato, Yasuo, Inoue, MichikoYear:
2019
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2019.2925365
File:
PDF, 2.98 MB
english, 2019