Highly Reliable Memory Architecture Using Adaptive...

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Highly Reliable Memory Architecture Using Adaptive Combination of Proactive Aging-aware In-Field Self-Repair and ECC

Mayuga, Gian, Sato, Yasuo, Inoue, Michiko
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2019.2925365
File:
PDF, 2.98 MB
english, 2019
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