Assessing AMS-RF Test Quality by Defect Simulation

IEEE Transactions on Device and Materials Reliability 2019 / 3 Vol. 19; Iss. 1

Assessing AMS-RF Test Quality by Defect Simulation

Gutierrez Gil, Valentin, Gines Arteaga, Antonio J., Leger, Gildas
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Volume:
19
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2894534
Date:
March, 2019
File:
PDF, 1.17 MB
english, 2019
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