Comparison of the Total Dose Responses of Fully Depleted...

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IEEE Transactions on Nuclear Science 2019

Comparison of the Total Dose Responses of Fully Depleted SOI nMOSFETs with Different Geometries for the Worst Case Bias Conditions

Zheng, Zhongshan, Zhao, Xing, Zhao, Kai, Gao, Jiantou, Li, Binhong, Yu, Fang, Li, Bo, Luo, Jiajun, Han, Zhengsheng, Liu, Xinyu
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2019.2936607
File:
PDF, 394 KB
english, 2019
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