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[IEEE 2005 66th ARFTG Conference Measurement Conference Digital Communication System Metrics (ARFTG) - Washington, DC, USA (2005.12.1-2005.12.2)] 2005 66th ARFTG Microwave Measurement Conference (ARFTG) - Statistical analysis of accuracy in noise figure measurements
Otegi, N., Collantes, J. M., Sayed, M.Year:
2005
Language:
english
DOI:
10.1109/arftg.2005.8373130
File:
PDF, 258 KB
english, 2005