[IEEE 2019 93rd ARFTG Microwave Measurement Conference (ARFTG) - Boston, MA, USA (2019.6.7-2019.6.7)] 2019 93rd ARFTG Microwave Measurement Conference (ARFTG) - A TRL Error-box Split Procedure to Compensate for the Bias Dependency Effects in Device Test-Fixtures
De Martino, C., Malotaux, E.S., Spirito, M.Year:
2019
Language:
english
DOI:
10.1109/arftg.2019.8739197
File:
PDF, 1.72 MB
english, 2019