[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Silicon Nitride Stress Liner Impacts on the Electrical Characteristics of AlGaN/GaN HEMTs
Cheng, Wei-Chih, Fang, Tao, Lei, Siqi, Zhao, Yunlong, He, Minghao, Chan, Mansun, Xia, Guangrui Maggie, Zhao, Feng, Yu, HongyuYear:
2019
Language:
english
DOI:
10.1109/edssc.2019.8754212
File:
PDF, 358 KB
english, 2019