[IEEE 2019 IEEE European Test Symposium (ETS) - Baden-Baden, Germany (2019.5.27-2019.5.31)] 2019 IEEE European Test Symposium (ETS) - Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling
Ahmed, Foisal, Shintani, Michihiro, Inoue, MichikoYear:
2019
Language:
english
DOI:
10.1109/ets.2019.8791542
File:
PDF, 573 KB
english, 2019