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[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - Investigation of the effects of Pulsed Direct Current at low frequencies on the Electromigration Lifetime : Student Paper

Passage, Jennifer M., Rogalskyj, Sophia, Azhari, Nabihah, Wilcox, Eric, Lloyd, J.R.
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Year:
2018
DOI:
10.1109/iirw.2018.8727088
File:
PDF, 164 KB
2018
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