[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices
Pedreira, G., Martin-Martinez, J., Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Castro-Lopez, R., Roca, E., Fernandez, F. V., Nafria, M.Year:
2019
Language:
english
DOI:
10.1109/irps.2019.8720582
File:
PDF, 832 KB
english, 2019