[IEEE 2019 International Symposium on Signals, Circuits and Systems (ISSCS) - Iasi, Romania (2019.7.11-2019.7.12)] 2019 International Symposium on Signals, Circuits and Systems (ISSCS) - A Wafer Yield Fluctuation Analysis Model Utilizing Least-Squares Spectral Analysis
Weber, Christian, Fathi, Madjid, Grunewald, Armin, Hahn, Kai, Bruck, Rainer, Montino, Ralf, Krumm, RolandYear:
2019
Language:
english
DOI:
10.1109/isscs.2019.8801802
File:
PDF, 504 KB
english, 2019