[IEEE 2019 II Workshop on Metrology for Industry 4.0 and...

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[IEEE 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) - Naples, Italy (2019.6.4-2019.6.6)] 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) - Multivariate Analysis of LTE Radio-Layer Parameters based on a Partitional Clustering Approach

Pasquino, Nicola, Ventre, Giorgio, Zinno, Stefania, Petrocelli, Sofia
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Year:
2019
Language:
english
DOI:
10.1109/metroi4.2019.8792873
File:
PDF, 805 KB
english, 2019
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