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Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test
Hong, Hao-Chiao, Lin, Long-YiYear:
2019
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2019.2924251
File:
PDF, 2.42 MB
english, 2019