The effect of stress state on AlN thin films and AlN/Finemet magnetoelectric composite device
Yin, Liping, Hu, Wenlong, Wu, Ming, Shi, Jiaxing, Zhu, JieVolume:
30
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-019-01772-5
Date:
August, 2019
File:
PDF, 903 KB
english, 2019