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Measurement of Displacement Derivatives Using Electronic Shear Speckle Pattern Interferometry (ESSPI)
Lam, C L, Lalor, M J, Leung, T P, Burton, D RVolume:
5
Language:
english
Journal:
HKIE Transactions
DOI:
10.1080/1023697x.1998.10667772
Date:
January, 1998
File:
PDF, 3.48 MB
english, 1998