Atomic force microscopy and IR spectrometry application in detecting the type and nature of contaminants on reverse osmosis membrane elements
Chichirova, N D, Chichirov, A A, Saitov, S RVolume:
288
Language:
english
Journal:
IOP Conference Series: Earth and Environmental Science
DOI:
10.1088/1755-1315/288/1/012007
Date:
July, 2019
File:
PDF, 950 KB
english, 2019