Atomic force microscopy and IR spectrometry application in...

Atomic force microscopy and IR spectrometry application in detecting the type and nature of contaminants on reverse osmosis membrane elements

Chichirova, N D, Chichirov, A A, Saitov, S R
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Volume:
288
Language:
english
Journal:
IOP Conference Series: Earth and Environmental Science
DOI:
10.1088/1755-1315/288/1/012007
Date:
July, 2019
File:
PDF, 950 KB
english, 2019
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