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[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Investigation on Short Circuit Test of 3300V SiC MOSFET
Chen, Hong, Chen, Ximing, Han, Zhonglin, Zhao, Yanli, Bai, Yun, Li, Chengzhan, Han, ZhengshengYear:
2019
Language:
english
DOI:
10.1109/EDSSC.2019.8754286
File:
PDF, 201 KB
english, 2019