[IEEE 2019 International Conference on IC Design and Technology (ICICDT) - SUZHOU, China (2019.6.17-2019.6.19)] 2019 International Conference on IC Design and Technology (ICICDT) - Performance Evaluation of Static Random Access Memory (SRAM) based on Negative Capacitance FinFET
Sun, Chen, Han, Kaizhen, Gong, XiaoYear:
2019
Language:
english
DOI:
10.1109/ICICDT.2019.8790831
File:
PDF, 581 KB
english, 2019