[IEEE 2018 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Chengdu (2018.5.7-2018.5.11)] 2018 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - A Method for Measuring the Gain of On-Wafer Antenna Based on Probe De-Embedding Technique
Zhao, Rui, Cai, Qing, Wang, Yahai, Yin, Zhijun, Zhou, YangYear:
2018
Language:
english
DOI:
10.1109/icmmt.2018.8563904
File:
PDF, 278 KB
english, 2018