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[IEEE 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Geneva, Switzerland (2017.10.2-2017.10.6)] 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Combined x-ray and gamma ray testing to investigate the TID tolerance of flip-chip FPGAs
Rezzak, Nadia, Wang, Jih-Jong, Nguyen, Victor, Dsilva, DurwynYear:
2017
Language:
english
DOI:
10.1109/radecs.2017.8696120
File:
PDF, 884 KB
english, 2017