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[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - On the use of Bayesian Networks for Resource-Efficient Self-Calibration of Analog/RF ICs
Andraud, Martin, Galindez, Laura, Lu, Yichuan, Makris, Yiorgos, Verhelst, MarianYear:
2018
Language:
english
DOI:
10.1109/test.2018.8624893
File:
PDF, 2.00 MB
english, 2018