Combined SIMS-SPM Instrument for High Sensitivity and High...

Microscopy and Microanalysis 2013 / 08 Vol. 19; Iss. S2

Combined SIMS-SPM Instrument for High Sensitivity and High Resolution Elemental 3D Analysis

Fleming, Y., Wirtz, T., Dowsett, D., Gerard, M., Gysin, U., Glatzel, T., Meyer, E., Maier, U., Wegmann, U.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
19
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927613005333
Date:
August, 2013
File:
PDF, 703 KB
english, 2013
Conversion to is in progress
Conversion to is failed