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[IEEE 2018 IEEE 2nd International Conference on Dielectrics (ICD) - Budapest (2018.7.1-2018.7.5)] 2018 IEEE 2nd International Conference on Dielectrics (ICD) - A Statistical Approach in Time-Frequency Domain Reflectometry for Enhanced Fault Detection
Ji, Gyeong Hwan, Lee, Geon Seok, Lee, Chun-Kwon, Kwon, Gu-Young, Lee, Yeong Ho, Shin, Yong-JuneYear:
2018
Language:
english
DOI:
10.1109/ICD.2018.8514743
File:
PDF, 410 KB
english, 2018