Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention
Perez, Eduardo, Zambelli, Cristian, Mahadevaiah, Mamathamba Kalishettyhalli, Olivo, Piero, Wenger, ChristianVolume:
7
Year:
2019
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2019.2931769
File:
PDF, 3.72 MB
english, 2019