A Method for Obtaining the Real Off-State Breakdown Voltage...

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A Method for Obtaining the Real Off-State Breakdown Voltage of AlGaN/GaN MIS-HEMTs in on-wafer tests by Optimizing Protective Layer

Gao, Sheng, Zhou, Quanbin, Li, Xianhui, Xie, Zijing, Wang, Hong
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Year:
2019
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2019.2935323
File:
PDF, 14.96 MB
english, 2019
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