Nanoelectronic COupled Problems Solutions: uncertainty...

Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem

Putek, Piotr, Janssen, Rick, Niehof, Jan, ter Maten, E. Jan W., Pulch, Roland, Tasić, Bratislav, Günther, Michael
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Volume:
8
Language:
english
Journal:
Journal of Mathematics in Industry
DOI:
10.1186/s13362-018-0054-3
Date:
December, 2018
File:
PDF, 2.40 MB
english, 2018
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