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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Study of Effect of downscaling on the Analog/RF Performance of Gate all Around JLMOSFET
Misra, Sarita, Mohan Biswal, Sudhanshu, Bara, Biswajit, Kumar Swain, Sanjit, Kumar Pati, SudhansuYear:
2018
DOI:
10.1109/EDKCON.2018.8770424
File:
PDF, 35 KB
2018