X-ray Diffraction Tomography Using Laboratory Sources for Studying Single Dislocations in a Low Absorbing Silicon Single Crystal
Zolotov, D. A., Asadchikov, V. E., Buzmakov, A. V., D’yachkova, I. G., Krivonosov, Yu. S., Chukhovskii, F. N., Suvorov, E. V.Volume:
55
Journal:
Optoelectronics, Instrumentation and Data Processing
DOI:
10.3103/S8756699019020031
Date:
March, 2019
File:
PDF, 462 KB
2019