Atom Probe Tomography of Oxidised Grain Boundaries in...

Microscopy and Microanalysis 2019 / 08 Vol. 25; Iss. S2

Atom Probe Tomography of Oxidised Grain Boundaries in Highly Irradiated SS316

Lindgren, Kristina, Jenssen, Anders, Tengstrand, Olof, Ekström, Peter, Efsing, Pål, Thuvander, Mattias
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Volume:
25
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619013394
Date:
August, 2019
File:
PDF, 404 KB
2019
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